optical thickness measurement
µ-thick and mm-thick systems
Systems from Nirox srl, Brescia/Italy
how does it work?
• patented by Nirox srl, it represents the latest
measuring solution available on the market to optically
• the measure is based on
the light reflected at
entrance and exit
interfaces (r1 e r2).
• optical head collect both reflections and make it possible to
obtain interference between them.
• the resulting optical signal intensity has a component
directly related to the physical thickness d and the index of
refraction n of the material.
• Materials measured : any transparent or semitransparent
material (colours and/or particular surface finish need specific testing); coating on substrates.
• What is measured : total thickness of a single or multi
layer structure; thickness of a single layer coated on
glass/metal. Layer discrimination of sandwich structure is
- Plastic material extrusion
- glass production lines (flat, hollow)
- Coating on glass or metal substrates
- Medical plastic devices
- Coating on optical devices
- Semiconductors, photo resist and oxides
- one-sided measure (reflection)
- high accuracy
- non-contact, non destructive measurement
- light used is not dangerous
- easy to use
- quick integration in laboratory and production lines.
• delivery of MI configured system with multiple optical
heads to measure cross-section wall thickness and
concentricity in order to improve material saving.
• delivery of MI measuring equipment with multiple
optical heads layout (wall-thickness and concentricity)
• delivery of supervisor system (panel-pc) with real-time
trend charts and SPC data (statistical process control)
• distributed optical heads: a single measuring unit with an
optical switch can drive several optical heads for distributed
• supervisor software : real-time data display and production
• laboratory scanner: delivery of stand-alone unit with motorized
x-y positioning system for measurement of thickness profile (1D)
or maps (2D)
• custom software: software customization for specific needs